OIML Tests

DF: The following faults are not considered as significant: - faults resulting from simultaneous causes independent from each other within the instrument itself or within its checking facility; - temporary faults resulting from momentary indication v

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  3. DF: The following faults are not considered as significant: - faults resulting from simultaneous causes independent from each other within the instrument itself or within its checking facility; - temporary faults resulting from momentary indication v
DF: The following faults are not considered as significant: - faults resulting from simultaneous causes independent from each other within the instrument itself or within its checking facility; - temporary faults resulting from momentary indication v

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Date of creation
12-Sep-2025
Accepted term
12-Sep-2025
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ARK
ark:/99152/t3o7z0grydx9p6
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  • Search DF: The following faults are not considered as significant: - faults resulting from simultaneous causes independent from each other within the instrument itself or within its checking facility; - temporary faults resulting from momentary indication v (Wikipedia (ES))
  • Search DF: The following faults are not considered as significant: - faults resulting from simultaneous causes independent from each other within the instrument itself or within its checking facility; - temporary faults resulting from momentary indication v (Google búsqueda exacta)
  • Search DF: The following faults are not considered as significant: - faults resulting from simultaneous causes independent from each other within the instrument itself or within its checking facility; - temporary faults resulting from momentary indication v (Google scholar)
  • Search DF: The following faults are not considered as significant: - faults resulting from simultaneous causes independent from each other within the instrument itself or within its checking facility; - temporary faults resulting from momentary indication v (Google images)
  • Search DF: The following faults are not considered as significant: - faults resulting from simultaneous causes independent from each other within the instrument itself or within its checking facility; - temporary faults resulting from momentary indication v (Google books)